JTAG / Boundary Scan Testing
JTAG, Boundary Scan Test Solutions
Tomorrow's electronics create new challenges for us. Increasing assembly complexity and decreasing test access require reliable technologies.The higher the quality of the individual components, the better the final result. Embedded JTAG Solutions opens the way for new test and programming methods of state-of-the-art electronics, whether in development or production.
Embedded Board Test
Embedded Board Test allows digital, static test of pins and networks. Functional tests can also be integrated. These include access to I2C and SPI components, measurement and evaluation of analog processor inputs, dynamic memory tests and test of high-speed interfaces (e.g. USB 3.0.).
A universal programming system today must support several scenarios. On-board programming distinguishes between the programming of serial Flash devices (I²C, SPI) and the programming of parallel Flashes (NOR, NAND). In addition, more and more data must be written into on-chip Flash memory. This often involves processors, controllers, or FPGAs. Users in production are encountering increasing demand to carry out these programming requirements in parallel on several boards.
Embedded Functional Test
Embedded Functional Test allows the integration of functional tests such as access to I2C and SPI components, measurement and evaluation of analog processor inputs, dynamic memory tests and test of high-speed interfaces (e.g. USB 3.0.). Typically these tests are used as an extension to existing structural tests (Boundary Scan, ICT or Flying Probe).